Diyala Journal for Pure Science
Scientific Refereed Journal Published By College of Science - University of Diyala
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Diyala Journal for Pure Science DJPS
P- ISSN:2222-8373, E-ISSN:2518-9255
Volume 14, Issue 1, Part 1 , Januar y. 2018
Preparation and Characterization of SiO2 Thin Films as an Antireflective Layer
Ammar T. Salih, Kadhim R. Gbashi and Tawfeeq Kadhem Salman
Year: 2018, Volume: 14, Issue: 1, Part:1
Pages: 68-77 , DOI: http://dx.doi.org/10.24237/djps.1401.331C
Uniform layers of SiO2 were prepared using thermal evaporation technique under high vacuum (10-5 mbar). Many characterizations were investigated using these films as antireflective layers. The morphological, crystal structural and optical properties of the layers were investigated by using SEM, XRD, and UV-Vis instruments.
Keywords: thin films, thermal evaporation, SiO2, antireflection.