About DJPS    Editorial Board        Secretary of Journal    Events & News         



Diyala Journal for Pure Science

Scientific Refereed Journal Published By College of Science - University of Diyala


Admin of Website


Diyala Journal for Pure Science DJPS


P- ISSN:2222-8373, E-ISSN:2518-9255

Volume 14, Issue 1, Part 1 , Januar y. 2018



Preparation and Characterization of SiO2 Thin Films as an Antireflective Layer

 Ammar T. Salih, Kadhim R. Gbashi and Tawfeeq Kadhem Salman

Year: 2018, Volume: 14, Issue: 1, Part:1

Pages: 68-77 , DOI: http://dx.doi.org/10.24237/djps.1401.331C 

Language: English

Download :  




Uniform layers of SiO2 were prepared using thermal evaporation technique under high vacuum (10-5 mbar). Many characterizations were investigated using these films as antireflective layers. The morphological, crystal structural and optical properties of the layers were investigated by using SEM, XRD, and UV-Vis instruments.


Keywordsthin films, thermal evaporation, SiO2, antireflection.

Copyright © 2017 Diyala Journal For Pure Science (DJPS) . All rights reserved